Survey reveals lower burnout rates among allergy and immunology Fellows-in-Training

A recent study published in the ‘The Journal of Allergy and Clinical Immunology’ led by Hemant Sharma revealed that physician burnout, may not be as rampant among Fellows-in-Training (FITs) in the field of allergy and immunology as it is among other healthcare specialties. Physician health and well-being are known to suffer due to burnout, which can have negative consequences on both professional and personal aspects of their lives.

This phenomenon often takes root during medical school, intensifies during residency and fellowship programs, and persists throughout a physician's career. A prior study among allergists and immunologists had depicted a 35% burnout rate. However, a critical gap in knowledge exists regarding the health and wellness status of FITs in this specialized field.

To address this gap, the American Academy of Allergy, Asthma & Immunology (AAAAI) conducted an extensive study. A questionnaire was distributed using the authentic mini-Z survey to about 388 fellows in allergy and immunology. This assessment comprised mini-Z questions but also required personal and professional demographic information, plus open-ended explorations about wellness.

Of the surveyed FITs, 82 completed the questionnaire with a 24% response rate. Surprisingly, the study found that the burnout rate among these FITs was only 39% which was considerably lower compared to the national average among practicing physicians in the United States. Also, 82% of FITs reported overall job satisfaction, with 72% expressing satisfaction or better control over their workload.

These outcomes shed light on specific concerns within the speciality of allergy and immunology that are unique to FITs. Tailored interventions could be developed to enhance the well-being of these medical professionals and minimize the risk of burnout, as suggested. There is a need for ongoing surveys directed towards evolving wellness challenges faced by FITs in this specialized field.